Key technical and IP issues
- 01
Document sensor placement, drive and sampling conditions in relation to measured signals.
- 02
Identify differences in filtering, calibration, feature extraction and sensor fusion.
- 03
Describe accuracy, sensitivity and noise robustness together with test conditions.
Information to support the initial review
- Sensor architecture and measurement environment
- Signal-processing steps, equations or pseudocode
- Calibration, test and comparison data
You can begin a discussion before all the documents are available. Your development stage and planned disclosures help us establish priorities and agree the scope of work.
Turning technical analysis into an IP plan
Our technical analysis guides prior art searches, filing strategy, prosecution and rights analysis. We agree the scope, deliverables and timetable for each engagement.